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Watanabe, Y.; Mooij, R.; Perera, G. M. Elsevier Inc. (2005)
Yurasov, S.; Hammersen, J.; Tiller, T.; Tsuiji, M.; Wardemann, H. John Wiley & Sons (2005)
Dhodapkar, M. V. John Wiley & Sons (2005)
Zhao, B.; Schwartz, L.; Flores, R.; Liu, F.; Kijewski, P.; Krug, L.; Rusch, V. SPIE (2005)
Zender, L.; Xue, W.; Cordon-Cardo, C.; Hannon, G. J.; Lucito, R.; Powers, S.; Flemming, P.; Spector, M. S.; Lowe, S. W. Cold Spring Harbor Laboratory Press (2005)
Weisel, K. C.; Moore, M. A. S. John Wiley & Sons (2005)
Varmus, H.; Pao, W.; Politi, K.; Podsypanina, K.; Du, Y. C. N. Cold Spring Harbor Laboratory Press (2005)
Townsend, D. J.; DiMarzio, C. A.; Laevsky, G.; Rajadhyaksha, M. SPIE (2005)
Sadelain, M.; Lisowski, L.; Samakoglu, S.; Rivella, S.; May, C.; Riviere, I. John Wiley & Sons (2005)
Reinhard, M. I.; Cornelius, I.; Prokopovich, D. A.; Wroe, A.; Rosenfeld, A. B.; Pisacane, V.; Ziegler, J. F.; Nelson, M. E.; Cucinotta, F.; Zaider, M.; more... IEEE (2005)