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Loo, K.; Petasecca, M.; Safavi, M.; Lerch, M.; Han, Z.; Jakubek, J.; Pospisil, S.; Meikle, S.; Zaider, M.; Bucci, J.; more... IEEE (2012)
Lewis, J. S. Aiche (2011)
Krebs, H. I.; Michmizos, K. P.; Monterosso, L.; Mast, J. IEEE (2011)
Abeytunge, S.; Li, Y.; Larson, B.; Toledo-Crow, R.; Rajadhyaksha, M. Optical Society of America (2011)
Cano, S. J.; Klassen, A. F.; Pusic, A. L. Curran Associates, Inc. (2011)
Thompson, C. B. Cold Spring Harbor Laboratory Press (2011)
Ortega-Martorell, S.; Lisboa, P. J. G.; Vellido, A.; Simões, R. V.; Julià-Sapé, M.; Arús, C. IEEE (2011)
Song, Y.; Mueller, B.; Obcemea, C.; Mychalczak, B. IEEE (2011)
Strashnikova, N. V.; Papiashvili, N.; Cohen-Luria, R.; Mark, S.; Shilon, G.; Khankin, D.; Kalisky, Y.; Kalisky, O.; Parola, A. H. SPIE (2011)
Song, Y.; Mueller, B.; Obcemea, C.; Mychalczak, B. Springer (2011)