Nuclear Science (NSS/MIC), IEEE Symposium

Published by: IEEE  

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  • Assessment of SPECT systems using multiple detector technologies
    Conference Paper

    Cronin, K. P.; Humm, J. L.; Woolfenden, J. M.; Clarkson, E.; Kupinski, M. A.; Furenlid, L. R.
    IEEE (2019)

    Fulltext@MSK | Save

    • Nuclear Science (NSS/MIC), IEEE Symposium – authorized name for:

    Name ISSN / ISBN Publisher
    Nuclear Science (NSS/MIC), IEEE Symposium 9781728141640 Institute of Electrical and Electronics Engineers Inc.
    Nuclear Science (NSS/MIC), IEEE Symposium 9781728141640 IEEE