Assessment of SPECT systems using multiple detector technologies Conference Paper

Authors: Cronin, K. P.; Humm, J. L.; Woolfenden, J. M.; Clarkson, E.; Kupinski, M. A.; Furenlid, L. R.
Title: Assessment of SPECT systems using multiple detector technologies
Conference Title: 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Abstract: Conventional SPECT systems, either rotating or stationary, are typically outfitted with a single type of detectors. The use of identical detectors simplifies design and reconstruction in these systems. However, when a single detector technology is used, all detectors suffer the same limitations, and image quality can only be improved through additional angular sampling, better collimation, or more optimal injection protocols. In this paper, we analyze the concept of utilizing two or more detector technologies during the same acquisition, and the potential impact on image quality of exploiting the benefits of each respective technology. There is always a tradeoff in designs between energy resolution, spatial resolution, sensitivity and count rate. A combination of SPECT technologies in a single system could reduce these limitations for a desired application. We have modeled a SPECT system with multiple detector technologies to compare it to systems with a single SPECT technology, but the same number of detectors. An analysis framework has been developed to explore the fundamental gains in performance that can be achieved when using multiple technologies and to study the implementation of image reconstruction with these datasets. © 2019 IEEE.
Keywords: detectors; image analysis; image enhancement; medical imaging; image quality; image reconstruction; spect; spatial resolution; task-based performance; analysis frameworks; detector technology; energy resolutions; multiple detectors; multiple technology; optimal injection; potential impacts
Journal Title Nuclear Science (NSS/MIC), IEEE Symposium
Conference Dates: 2019 Oct 26-Nov 2
Conference Location: Manchester, UK
ISBN: 9781728141640
Publisher: IEEE  
Date Published: 2019-01-01
Start Page: 9059990
Language: English
DOI: 10.1109/nss/mic42101.2019.9059990
PROVIDER: scopus
Notes: Conference Paper -- Export Date: 1 May 2020 -- Source: Scopus
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MSK Authors
  1. John Laurence Humm
    366 Humm
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