Unsupervised wrinkle detection in reflectance confocal microscopy images of the human skin Conference Paper


Authors: Sourati, J.; Brooks, D. H.; Dy, J. G.; Ataer-Cansizoglu, E.; Erdogmus, D.; Rajadhyaksha, M.
Title: Unsupervised wrinkle detection in reflectance confocal microscopy images of the human skin
Conference Title: 2012 IEEE International Conference on Acoustics, Speech, and Signal Processing, ICASSP 2012
Abstract: Reflectance confocal microscopy (RCM) is a non-invasive and in-vivo imaging modality, which can take images from different depths of the human skin. A challenging problem is to detect a clinically important subsurface section of the skin, the Dermis/Epidermis junction, in RCM images. This is a tough problem because of the huge variation of texture and intensity features across both intersubject and intrasubject tissues. On the other hand, there's almost no wrinkle-free part of the skin. This well-known phenomenon can be used as a histological clue for guessing the probability of being Dermis or Epidermis in the neighboring regions. In this paper, we develop a two-step wrinkle detector for RCM images. By analyzing the results on different RCM images, we conclude it has high sensitivity and specificity, but a relatively lower Jaccard index. © 2012 IEEE.
Keywords: detectors; reflectance confocal microscopy; confocal microscopy; human skin; reflectance confocal microscopies; reflection; signal processing; in-vivo imaging; high sensitivity; tissue; dermis-epidermis junction; wrinkle detection; jaccard index
Journal Title IEEE International Conference on Acoustics, Speech and Signal Processing. Proceedings
Conference Dates: 2010 Mar 25-30
Conference Location: Kyoto, Japan
ISBN: 1520-6149
Publisher: IEEE  
Location: Kyoto, Japan
Date Published: 2012-01-01
Start Page: 705
End Page: 708
Language: English
DOI: 10.1109/ICASSP.2012.6287981
PROVIDER: scopus
DOI/URL:
Notes: --- - ICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedings - ICASSP IEEE Int Conf Acoust Speech Signal Process Proc - "Conference code: 93091" - "Export Date: 2 November 2012" - "Art. No.: 6287981" - "CODEN: IPROD" - "Sponsors: Inst. Electr. Electron. Eng. Signal Process. Soc." - 25 March 2012 through 30 March 2012 - "Source: Scopus"
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