MTKD-LRS: Semi supervised knee cartilage segmentation using Eigen low rank subspace assisted mean-teacher framework Conference Paper


Authors: Khawer, A.; Khan, S.; Qureshi, R.; Awais, M.; Chen, W.; Wu, J.
Title: MTKD-LRS: Semi supervised knee cartilage segmentation using Eigen low rank subspace assisted mean-teacher framework
Conference Title: 2025 IEEE 22nd International Symposium on Biomedical Imaging
Abstract: Segmentation of cartilages to examine the Knee osteoarthritis is a challenging problem in medical image analysis, due to distribution gaps in source and target domains. Existing models trained on one MRI domain struggle to generalize to MRI scans produced from different scanners, highlighting the need to develop novel approaches to adapt to cross-modalities. In this paper, we propose a novel Eigen Low-rank subspace-assisted Mean Teacher Knowledge Distillation framework (MTKD-LRS) using a semi-supervised learning approach. This framework leverages the low-rank approximations within the deep feature subspaces to capture meaningfullatent patterns and construct the domain-invariant feature representations. By preserving robust feature maps associated with larger singular values and leveraging the lower singular value feature maps as successive truncated noise, the student model is optimized with more robust supervision to bridge the gap between the cross-modality MRI data. Extensive experiments on public and private datasets demonstrate the effectiveness of MTKD-LRS over existing state-of-the-art approaches. © 2025 IEEE.
Keywords: diagnostic radiography; support vector machines; image segmentation; deep learning; semi-supervised learning; cross modality; self-supervised learning; eigen-value; eigen values; knee-segmentation; knowledge distillation; low-rank sub-spaces; feature map; low-rank sub-space; semi-supervised; singular values; sub-spaces
Journal Title Proceedings of the International Symposium on Biomedical Imaging
Conference Dates: 2025 Apr 14-17
Conference Location: Houston, TX
ISBN: 1945-7928
Publisher: IEEE  
Date Published: 2025-01-01
Start Page: 1571075894
Language: English
DOI: 10.1109/isbi60581.2025.10980909
PROVIDER: scopus
DOI/URL:
Notes: Conference paper (ISBN: 979-8-3315-2053-3) -- Source: Scopus
Altmetric
Citation Impact
BMJ Impact Analytics
MSK Authors
  1. Muhammad Awais
    3 Awais