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Woods, R. S. R.; Fitzgerald, C. W. R.; Valero, C.; Lopez, J.; Morris, L. G. T.; Cohen, M. A.; Wong, R. J.; Patel, S. G.; Ghossein, R. A.; Tuttle, R. M.; more... Elsevier Inc. (2023)
Acosta-Jiménez, S.; Camarillo-Cisneros, J.; Guzmán-Pando, A.; González-Chávez, S. A.; Galván-Tejada, J. I.; Ramírez-Alonso, G.; Pacheco-Tena, C. F.; Ochoa-Albiztegui, R. E. Springer (2023)
El-Kebir, M.; Morris, Q.; Oesper, L.; Sahinalp, S. C. World Scientific Publ Co Pte Ltd (2022)
Nakajima, I.; Tsuji, M.; Yagi, Y. Institute of Electrical and Electronics Engineers Inc. (2022)
Tosh, C.; Hsu, D. Journal Machine Learning Research (2022)
Lolos, A.; Boone, J. H.; Alexopoulos, C.; Goldsman, D.; Dingec, K. D.; Mokashi, A. C.; Wilson, J. R. Institute of Electrical and Electronics Engineers Inc. (2022)
Belkhatir, Z.; Iyer, A.; Mathews, J. C.; Pouryahya, M.; Nadeem, S.; Deasy, J. O.; Apte, A. P.; Tannenbaum, A. R. Institute of Electrical and Electronics Engineers Inc. (2022)
Mojtahedi, R.; Hamghalam, M.; Do, R. K. G.; Simpson, A. L. Springer (2022)
Chang, S.; Gao, Y.; Pomeroy, M. J.; Bai, T.; Zhang, H.; Liang, Z. SPIE (2022)
Ghahremani, P.; Marino, J.; Dodds, R.; Nadeem, S. IEEE (2022)