Former Employee. Radiology; Associate Attending
Andreou, C.; Plakas, K.; Berisha, N.; Gigoux, M.; Pal, S.; Merghoub, T.; Detty, M.; Kircher, M. SPIE (2024)
Zhao, C.; Liu, Z.; Chang, C. C.; Chen, Y. C.; Zhang, Q.; Zhang, X. D.; Andreou, C.; Pang, J.; Liu, Z. X.; Wang, D. Y.; more... ACS Nano (2023)
Pal, S.; Koneru, J. K.; Andreou, C.; Rakshit, T.; Rajasekhar, V. K.; Wlodarczyk, M.; Healey, J. H.; Kircher, M. F.; Mondal, J. ACS Applied Nano Materials (2022)