A semiparametric approach to the one-way layout Journal Article


Authors: Fokianos, K.; Qin, J.; Kedem, B.; Short, D. A.
Article Title: A semiparametric approach to the one-way layout
Abstract: We consider m distributions in which the first m-1 are obtained by multiplicative exponential distortions of the mth distribution, which is a reference. The combined data from rn samples, one from each distribution, are used in the semiparametric large-sample problem of estimating each distortion and the reference distribution and testing the hypothesis that the distributions are identical. The approach generalizes the classical normal-based one-way analysis of variance in the sense that it obviates the need for a completely specified parametric model. An advantage is that the probability density of the reference distribution is estimated from the combined data and not only from the mth sample. A power comparison with the t and F tests and with two nonparametric tests, obtained by means of a simulation, points to the merit of the present approach. The method is applied to rain-rate data from meteorological instruments.
Keywords: problem solving; regression analysis; logistic regression; mathematical models; estimation
Journal Title: Technometrics
Volume: 43
Issue: 1
ISSN: 0040-1706
Publisher: Amer Statistical Assoc  
Date Published: 2001-02-01
Start Page: 56
End Page: 65
Language: English
DOI: 10.1198/00401700152404327
PROVIDER: scopus
DOI/URL:
Notes: Export Date: 21 May 2015 -- Source: Scopus
Altmetric
Citation Impact
BMJ Impact Analytics
MSK Authors
  1. Jing Qin
    86 Qin