Authors: | Nayak, L.; Deangelis, L. M.; Wen, P. Y.; Brandes, A. A.; Soffietti, R.; Peereboom, D. M.; Lin, N. U.; Chamberlain, M.; Macdonald, D.; Galanis, E.; Perry, J.; Jaeckle, K.; Mehta, M.; Stupp, R.; Van Den Bent, M.; Reardon, D. A. |
Abstract Title: | The neurologic assessment in neuro-oncology (Nano) scale: A tool to assess neurologic function for integration in the radiologic assessment in neuro-oncology (Rano) criteria |
Meeting Title: | 4th Quadrennial Meeting of the World Federation of Neuro-Oncology (WFNO)/18th Annual Meeting of the Society for Neuro-Oncology (SNO) |
Journal Title: | Neuro-Oncology |
Volume: | 15 |
Issue: | Suppl. 3 |
Meeting Dates: | 2013 Nov 21-24 |
Meeting Location: | San Francisco, CA |
ISSN: | 1522-8517 |
Publisher: | Oxford University Press |
Date Published: | 2013-01-01 |
Start Page: | iii123 |
Language: | English |
ACCESSION: | WOS:000327456200493 |
PROVIDER: | wos |
DOI: | 10.1093/neuonc/not182 |
Notes: | Meeting Abstract: NO-101 -- Source: Wos |