Automated localization of wrinkles and the dermo-epidermal junction in obliquely-oriented reectance confocal microscopic images of human skin Conference Paper

  

Authors:	Sourati, J.; Kose, K.; Rajadhyaksha, M.; Dy, J. G.; Erdogmus, D.; Brooks, D. H.
Title:	Automated localization of wrinkles and the dermo-epidermal junction in obliquely-oriented reectance confocal microscopic images of human skin
Conference Title:	Photonic Therapeutics and Diagnostics IX
Abstract:	Reflectance Confocal Microscopic (RCM) imaging of obliquely-oriented optical sections, rather than with traditional z-stacks, shows depth information that more closely mimics the appearance of skin in orthogonal sections of histology. This approach may considerably reduce the amount of data that must be acquired and processed. However, as with z-stacks, purely visual detection of the dermal-epidermal junction (DEJ) in oblique images remains challenging. Here, we have extended our original algorithm for localization of DEJ in z-stacks to oblique images. In addition, we developed an algorithm for detecting wrinkles, which in addition to its intrinsic merit, gives useful information for DEJ detection. © 2013 SPIE.
Keywords:	algorithms; dermal-epidermal junctions; dermis/epidermis junction localization; obliquely-oriented sectioning; reectance confocal microscopy; wrinkles; confocal microscopic image; depth information; optical sections; original algorithms
Journal Title	Proceedings of SPIE
Volume:	8565
Conference Dates:	2013 Feb 2-7
Conference Location:	San Francisco, CA
ISBN:	0277-786X
Publisher:	SPIE
Location:	San Francisco, CA
Date Published:	2013-01-01
Start Page:	856503
Language:	English
PROVIDER:	scopus
DOI:	10.1117/12.2006489
DOI/URL:	http://www.scopus.com/inward/record.url?eid=2-s2.0-84878181937&partnerID=40&md5=05b76d797402ef0fd80e4c5071a3a91f
Notes:	--- - Progress in Biomedical Optics and Imaging - Proceedings of SPIE - Progr. Biomed. Opt. Imaging Proc. SPIE - "Conference code: 97149" - "Export Date: 1 July 2013" - ":doi 10.1117/12.2006489" - "Sponsors: The Society of Photo-Optical Instrumentation Engineers (SPIE)" - 2 February 2013 through 7 February 2013 - "Source: Scopus"

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