A fast and accurate contour tracing (FACT) method for custom electron cutout using a beam's eye view (BEV) camera Meeting Abstract
| Authors: | Sohn, J.; Park, J.; Kim, S. |
| Abstract Title: | A fast and accurate contour tracing (FACT) method for custom electron cutout using a beam's eye view (BEV) camera |
| Meeting Title: | 64th Annual Meeting and Exhibition of the American Association of Physicists in Medicine (2022 AAPM) |
| Journal Title: | Medical Physics |
| Volume: | 49 |
| Issue: | 6 |
| Meeting Dates: | 2022 Jul 10-14 |
| Meeting Location: | Washington, D.C. |
| ISSN: | 0094-2405 |
| Publisher: | American Association of Physicists in Medicine |
| Date Published: | 2022-06-01 |
| Start Page: | e834 |
| Language: | English |
| ACCESSION: | WOS:000808579203341 |
| PROVIDER: | wos |
| PUBMED: | 35678486 |
| DOI: | 10.1002/mp.15769 |
| Notes: | Meeting Abstract: PO-GePV-T-76 -- Source: Wos |
