Multi-resolution analysis of edge-texture features for mammographic mass classification Journal Article


Authors: Rabidas, R.; Midya, A.; Chakraborty, J.; Arif, W.
Article Title: Multi-resolution analysis of edge-texture features for mammographic mass classification
Abstract: In this paper, multi-resolution analysis of two edge-texture based descriptors, Discriminative Robust Local Binary Pattern (DRlbp) and Discriminative Robust Local Ternary Pattern (DRltp), are proposed for the determination of mammographic masses as benign or malignant. As an extension of Local Binary Pattern (LBP) and Local Ternary Pattern (LTP), DRlbp and LTP-based features overcome the drawbacks of these features preserving the edge information along with texture. With the hypothesis that multi-resolution analysis of these features for different regions related to mammaographic masses with wavelet transform will capture more discriminating patterns and thus can help in characterizing masses. In order to evaluate the efficiency of the proposed approach, several experiments are carried out using the mini-MIAS database where a 5-fold cross validation technique is incorporated with Support Vector Machine (SVM) on the optimal set of features obtained via stepwise logistic regression method. An area under the receiver operating characteristic (ROC) curve (Az value) of 0.96 is achieved with DRlbp attributes as the best performance. The superiority of the proposed scheme is established by comparing the obtained results with recently developed other competing schemes. © 2020 World Scientific Publishing Company.
Keywords: breast cancer; mammography; support vector machines; logistic regression; textures; wavelet transforms; multiresolution analysis; wavelet transform; receiver operating characteristic curves; local binary patterns; mass classification; mass classifications; logistic regression method; discriminative robust local ternary pattern; discriminative robust local binary pattern; local ternary patterns; support vector regression; cross-validation technique; local ternary patterns (ltp)
Journal Title: Journal of Circuits, Systems and Computers
Volume: 29
Issue: 10
ISSN: 0218-1266
Publisher: World Scientific Publishing Company  
Date Published: 2020-08-01
Start Page: 2050156
Language: English
DOI: 10.1142/s021812662050156x
PROVIDER: scopus
DOI/URL:
Notes: Article -- Export Date: 1 December 2020 -- Source: Scopus
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  1. Abhishek Midya
    17 Midya