Authors: | Hoffmann, S.; Lobbes, M.; Houben, I.; Pinker-Domenig, K.; Wengert, G.; Burgeth, B.; Meyer-Bäse, U.; Lemaitre, G.; Meyer-Baese, A. |
Title: | Computer-aided diagnosis of diagnostically challenging lesions in breast MRI: A comparison between a radiomics and a feature-selective approach |
Conference Title: | Sensing and Analysis Technologies for Biomedical and Cognitive Applications 2016 |
Abstract: | Diagnostically challenging lesions pose a challenge both for the radiological reading and also for current CAD systems. They are not well-defined in both morphology (geometric shape) and kinetics (temporal enhancement) and pose a problem to lesion detection and classification. Their strong phenotypic differences can be visualized by MRI. Radiomics represents a novel approach to achieve a detailed quantification of the tumour phenotypes by analyzing a large number of image descriptors. In this paper, we apply a quantitative radiomics approach based on shape, texture and kinetics tumor features and evaluate it in comparison to a reduced-order feature approach in a computer-aided diagnosis system applied to diagnostically challenging lesions. © 2016 SPIE. |
Keywords: | magnetic resonance imaging; classification; kinetics; medical imaging; tumors; diagnosis; breast magnetic resonance imaging; computer-aided diagnosis; computer aided diagnosis; classification (of information); object recognition; radiomics; diagnostically challenging lesions; morphological and kinetic features; breast magnetic-resonance imaging; computer aided diagnosis systems; image descriptors; kinetic features; lesion detection; phenotypic differences |
Journal Title | Proceedings of SPIE |
Volume: | 9871 |
Conference Dates: | 2016 Apr 17-18 |
Conference Location: | Baltimore, MD |
ISBN: | 0277-786X |
Publisher: | SPIE |
Date Published: | 2016-01-01 |
Start Page: | 98710H |
Language: | English |
DOI: | 10.1117/12.2228994 |
PROVIDER: | scopus |
DOI/URL: | |
Notes: | Conference Paper -- Conference code: 124026 -- Export Date: 2 November 2016 -- The Society of Photo-Optical Instrumentation Engineers (SPIE) -- 17 April 2016 through 18 April 2016 -- Source: Scopus |