Proceedings of the 16th IEEE International Conference on Machine Learning and Applications

Published by: IEEE  

People

  1. Breitbart
    Breitbart
  2. Li
    Li
  3. Pessin
    Pessin

Groups

  1. Behavioral Sciences Service (1)
  2. Biostatistics Service (1)
  3. Epidemiology and Biostatistics (1)
  4. Population Sciences Research Program (1)
  5. Psychiatry Service (1)
  6. Psychiatry and Behavioral Sciences, Department of (1)
Search Within
  1. "Population Sciences Research Program"
Formats
  1. Conference Paper (1)
Groups
  1. Behavioral Sciences Service (1)
  2. Biostatistics Service (1)
  3. Epidemiology and Biostatistics (1)
  4. Population Sciences Research Program (1)
  5. Psychiatry Service (1)
  6. Psychiatry and Behavioral Sciences, Department of (1)
People
  1. Hayley Pessin (1)
  2. William Breitbart (1)
  3. Yuelin Li (1)
Years
  1. 2017 (1)
Publishers
  1. IEEE (1)

Results (1)


Citation style sort is year ascending, and then by author or title. Author ascending is default.
  • Bayesian nonparametric clustering of patients with advanced cancer on anxiety and depression
    Conference Paper

    Li, Y.; Rosenfeld, B.; Pessin, H.; Breitbart, W.
    IEEE (2017)

    Fulltext@MSK | Save

    • Proceedings of the 16th IEEE International Conference on Machine Learning and Applications – authorized name for:

    Name ISSN / ISBN Publisher
    Proceedings of the 16th IEEE International Conference on Machine Learning and Applications 978-1-5386-1417-4 Institute of Electrical and Electronics Engineers Inc.
    Proceedings of the 16th IEEE International Conference on Machine Learning and Applications 978-1-5386-1417-4 IEEE
    2017 16th IEEE International Conference on Machine Learning and Applications 978-1-5386-1417-4 Institute of Electrical and Electronics Engineers Inc.
    Proceedings - 16th IEEE International Conference on Machine Learning and Applications, ICMLA 2017 9781538614174 Institute of Electrical and Electronics Engineers Inc.
    Proceedings of the 16th IEEE International Conference on Machine Learning and Applications 978-1-5386-1417-4 IEEE